Effect of Deep-Level Defects on Transient Photoconductivity of Semi-Insulating 4H-SiC

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Capacitance transient study of a bistable deep level in e(-)-irradiated n-type 4H-SiC

Using capacitance transient techniques, a bistable center, here called FB-center, was observed in electron irradiated 4H-SiC. In configuration A, the deep level known as EH5 (Ea = EC − 1.07 eV) is detected in the deep level transient spectroscopy spectrum, whereas for configuration B no obvious deep level is observed in the accessible part of the band gap. Isochronal annealing revealed the tran...

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ژورنال

عنوان ژورنال: Acta Physica Polonica A

سال: 2014

ISSN: 0587-4246,1898-794X

DOI: 10.12693/aphyspola.125.1042